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Derniers dépôts
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Soumya Ranjan Panda, Philippine Billy, Alexis Gauthier, Nicolas Guitard, Pascal Chevalier, et al.. Next Generation SiGe HBTs for Energy Efficient Microwave Power Amplification (Invited). 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Mar 2024, Bangalore, India. pp.1-3, ⟨10.1109/EDTM58488.2024.10511770⟩. ⟨hal-04603010⟩
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B. Pinault, Jean-Guy Tartarin, D. Saugnon, R. Leblanc. Impact of RF stress on different topologies of 100 nm X-band robust GaN LNA. Microelectronics Reliability, 2023, Special issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023, 150, pp.115126. ⟨10.1016/j.microrel.2023.115126⟩. ⟨hal-04493506⟩
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Jean Alinei, Guillaume Arthaud, Luiz Fernando Lavado Villa, Antonio Orgiu, Sahar Karaani, et al.. Improving the repairability of technical systems, a methodological proposal based on collaborative documentation -Example/case of an open source power converter. SGE - Symposium de Génie Electrique 2023, Jul 2023, Lille, France. ⟨hal-04490872⟩